Beam Profile Monitors1

Fixed Step Grid
Fixed Step Grid
Profiler and actuator
Profiler and actuator
Multi-plane ion beam profile measurement

When particles of an ion beam hit a wire of the grid, secondary electrons are emitted resulting in an electrical current.

Originally designed by the CEA/CNRS at GANIL (Grand Accélérateur National d’Ions Lourds), grids of W/Au wires are arranged together across the transversal plane of the beam propagation. Each wire collects a small part of the beam resulting in a signal which is proportional to each beamlet intensity.

All the signals are multiplexed with a dedicated high performance data acquisition electronic system. The software displays a dynamic histogram of both planes with high precision both in intensity and position.

Beam energy: from few keV/A to 100 MeV/A

Beam intensity: 1 nA to 100 μA continuous beam mode or higher intensities when pulsed²

47 wire per grid for different beam size: • 23 or 47 mm at 0,5 to 1 mm steps • 70 or 87 mm at 3, 2, 1 mm variable steps

Wire diam.: 70 to 150 μm

Flanges: 160 (CF/ISOF/KF) or 200 (CF)

Actuator stroke: 120 or 210 mm

Leak rate: < 10⁻⁸ mbar·l·s⁻¹

1 The SEM profilers are provided under a CEA/CNRS licence.
2 The temperature of a single wire is to be kept below 1200°C. Its diameter is customized to your application.


    Einzel Lens
    Einzel Lens
    Emittance Scanners
    Emittance Scanners
    Faraday Cups
    Faraday Cups