Beam Profile Monitors1
Secondary Emission Monitor (SEM)
Multi-plane ion beam profile measurementWhen particles of an ion beam hit a wire of the grid, secondary electrons are emitted resulting in an electrical current.
Originally designed by the CEA/CNRS at GANIL (Grand Accélérateur National d’Ions Lourds), grids of W/Au wires are arranged together across the transversal plane of the beam propagation. Each wire collects a small part of the beam resulting in a signal which is proportional to each beamlet intensity.
All the signals are multiplexed with a dedicated high performance data acquisition electronic system. The software displays a dynamic histogram of both planes with high precision both in intensity and position.
Beam energy: from few keV/A to 100 MeV/A
Beam intensity: 1 nA to 100 μA continuous beam mode or higher intensities when pulsed²
47 wire per grid for different beam size: • 23 or 47 mm at 0,5 to 1 mm steps • 70 or 87 mm at 3, 2, 1 mm variable steps
Wire diam.: 70 to 150 μm
Flanges: 160 (CF/ISOF/KF) or 200 (CF)
Actuator stroke: 120 or 210 mm
Leak rate: < 10⁻⁸ mbar·l·s⁻¹
1 The SEM profilers are provided under a CEA/CNRS licence.
2 The temperature of a single wire is to be kept below 1200°C. Its diameter is customized to your application.
Datasheet
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